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Background

Physics and materials science in a nanoscopic scale have grown exponentially in the past two decades, with no sign of slowing down. The key driving force in this rapid development is the perfection of tools and test methods that enable scientists to study materials with atomic resolution. Indeed, the Nobel Prize in Physics of 1986 was awarded to the scientists who invented transmission electron microscope and scanning tunneling microscope. Today, the transmission electron microscopy has further advanced in its ultimate resolution both in imaging and spatially resolved analytical capability. Without this, the studies of nanomaterials cannot be precise and quantitative, and nanotechnology development will be stalled. In parallel to this rapid development, scanning probe microscopy has grown even more spectacularly and accelerated our understanding of surfaces and nanostructures on surfaces. The growth is not confined to the improvement in spatial resolution, but extends to the development of new hardware and software for various spectroscopies for studying electronic structures, magnetic properties, and surface dynamics. The mastering of these microscopic tools and methods is crucial and prerequisite in conducting world-class scientific research on nanomaterials and nanostructures on surfaces.

Lecturers

COLLIEX, Christian, Universite of Paris-Sud, France
HEINRICH, Andreas, IBM, USA
HO, Wilson, University of California, Irvine, USA
HOWIE, Archie, Cavendish Laboratory, UK
IIJIMA, Sumio, Meijo University, Japan
SALMERON, Miquel, Lawrence Berkeley National Laboratory, USA

Invited Speakers

CHEN, Fu-Rong, National Tsing Hua University, Taiwan
CHEN, Qing, Peking University, China
CHU, Ming-Wen, National Taiwan University, Taiwan
FUNG, Kwok Kwong, The Hong Kong University of Science & Technology, China
GAO, Hong-Jun, Institute of Physics, CAS, China
PAI, Woei-Wu, National Taiwan University, Taiwan
PENG, Lian-Mao, Peking University, China
SUI, Man-Ling, Institute of Metal Research, CAS, China
TANG, Dong, FEI Company, The Netherlands
VAN HOVE, Michel A., City University of Hong Kong, China
WANDELT, Klaus, University of Bonn, Germany
WANG, Bing, University of Science and Technology of China, China
WANG, Chen, National Center for Nanoscience and Technology, China
WANG, Ke-Dong, The Chinese University of Hong Kong, China
XIE, Mao-Hai, The University of Hong Kong, China
XUE, Qi-Kun, Tsinghua University, China

Topics Covered Include

- Transmission electron microscopy
- Scanning probe microscopy
- Nanomaterials
- Surfaces, atomic structures
- Spectroscopies

Organizing Committee

Quan Li (Director), The Chinese University of Hong Kong
Hai-Qing Lin, The Chinese University of Hong Kong
Nian Lin, Hong Kong University of Science and Technology
Michel A. Van Hove, City University of Hong Kong
Xu-Dong Xiao, The Chinese University of Hong Kong

Enquiries

Please contact Ms. P. Y. Ho of the Chinese University of Hong Kong at pyho@phy.cuhk.edu.hk.