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The Chinese University of Hong Kong

Department of Electronic Engineering & Materials Science and Technology Research Center

My research interests include scanning probe techniques: STM, AFM, EFM, etc.; near-field techniques for sensing and imaging: optical and thermal methods; interface engineering for electronic/photonic materials and devices; physics and technology of organic semiconductors; functional oxides: fundamentals and applications; nanomaterials and nanodevices; nanoscopic energy transfer and conversion; ultrasonic techniques: instrumentation and measurement; information storage; non-destructive testing and evaluation; low-noise electronics.

     STM: Front Close-up

To Contact :

Postal Address: Room 404, Ho Sin Hang Engineering Building

The Chinese University of Hong Kong Shatin, New Territories, Hong Kong

Telephone: +852 2609-8297

Fax: +852 2603-5558 

Email: jbxu@ee.cuhk.edu.hk   

Research Areas

 Current Research Interests:

 

■  Near-field and Nanoscopic Sensing and Imaging (e.g., scanning tunneling microscopy

    (STM), atomic force microscopy (AFM), thermal microscopy, NSOM, EFM, etc.)

 

■  Nanotechnology for Electronics/Photonics (e.g., nanomaterials, nanodevices, etc.)

 

■  Thin Film Technology (e.g., electronic thin films, interface engineering of

    advanced electronic/photonic devices, advanced functional oxides and devices, etc.)

 

■  Physics and Technology of Organic Semiconductor Devices (e.g. organic light emitting

    devices (OLEDs), organic devices, etc)

 

■  Oxide Based Electronic and Photonic Materials and Devices

 

■  Solar Energy Technology