PHYS5350 Techniques in Materials Characterization
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PHYS5350 Techniques in Materials Characterization

Principles and operation of materials characterization techniques using photon, electron, atom and ion sources. This course also provides experiments on microstructural analysis of materials for practice and illustration of selected subject matters as well as presentations.
Lecturer

  • Prof. Lu Xinhui
    Office: Rm G11, Tel: 39436350, Email: xinhui.lu@cuhk.edu.hk

    • Teaching Assistant(s)

  • Mr. Qin Minchao
    Office: SC 315, tel: 60986944, Email: qinminchao123@gmail.com
    Consultation hours: Mon 10:30-12:15

  • Mr. Zhuang Yuan
    Office: SC 351, tel: 68593073, Email: yzhuang@phy.cuhk.edu.hk
    Consultation hours: Thu 10:30-12:15

  • Mr. Kong Yifan
    Office: SC 351, tel: 56026124, Email: yfkong@link.cuhk.edu.hk
    Consultation hours: Thu 15:30-17:15


    • Lecture Class

  • Wednesday 12:30 - 14:15 (Science Centre L5)
  • Friday 11:30 - 12:15 (Science Centre L5)

    • Tutorial Class

  • Fri 12:30-13:15 (Science Centre L5)

    • Textbook(s)

    See reference

    Reference Books

  • P. E. F. Flewitt and R. K. Wild, Physical Methods for Materials Characterization, Institute of Physics (IOP) Publishing Ltd., 2nd ed. 2003
  • C. R. Brundle, C. A. Evans Jr., and S. Wilson, Encyclopaedia of Materials Characterization, Butterworth-Heinemann & Manning Publications Co., 1992
  • J. C. Riviere, Surface Analytical Techniques, Clarendon Press, Oxford, 1990
  • D. A. Skoog,, F. J. Holler, and T. A. Nieman, Principles of Instrumental Analysis, 5th ed.,Saunders College Publishing, 5th ed. 1998
  • B. D. Cullity, Element of X-ray Diffraction, 2nd ed., Addison-Wiley Publisher, 1978
  • P. B. Hirsch, H. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals, Butterworths, 1965
  • H. E. Duckworth, R.C. Barbar, and V.S.Venkatasubramanian, Mass Spectroscopy, 2nd ed. Cambridge University Press, 1986
  • C. N. Banwell, E. M. McCash. Fundamentals of Molecular Spectroscopy, 4th ed. London, New York : McGraw-Hill, 1994
  • W. Czanderna, T. E. Madey, and C. J. Powell, Beam effects, surface topography and depth profiling in surface analysis, Kluwer Academic, New York, 2002

    • Assessment Scheme

    Homework 20%
    Labs 25%
    Presentation 25%
    Final Exam30%

    Course Outline

  • Surface characterization (10 lectures)
  • Chromatography (4 lectures)
  • Mass spectroscopy (8 lectures)
  • Particle beam techniques (8 lectures)
  • Spectroscopy (8 lectures)